2003 GaAs Reliability Workshop : proceedings : November 9, 2003, San Diego, California

著者

• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

書誌事項

2003 GaAs Reliability Workshop : proceedings : November 9, 2003, San Diego, California

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers

JEDEC, [2003]

• : softbound

注記

"IEEE catalog number 03TH8723"--T.p. verso

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA7156583X
• ISBN:
  • 0790801043
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Arlington, Va,
• ページ数/冊数: vii, 156 p.
• 大きさ: 28 cm