Annual Reliability and Maintainability Symposium, 2005 proceedings : the International Symposium on Product Quality and Integrity, Alexandria, Virginia, USA, 2005 January 24-27

書誌事項

Annual Reliability and Maintainability Symposium, 2005 proceedings : the International Symposium on Product Quality and Integrity, Alexandria, Virginia, USA, 2005 January 24-27

Institute of Electrical and Electronics Engineers, c2005

  • : soft

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注記

"IEEE catalog number: 05CH37617"--T. p. verso

Includes bibliographies and indexes

詳細情報

  • NII書誌ID(NCID)
    BA72010819
  • ISBN
    • 0780388240
  • LCCN
    78132873
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Piscataway, NJ
  • ページ数/冊数
    645 p.
  • 大きさ
    28 cm
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