Autotestcon 2004 proceedings : IEEE Systems Readiness Technology Conference : technology and tradition unite in San Antonio

Author(s)

• Autotestcon
• IEEE Aerospace and Electronic Systems Society
• IEEE Instrumentation and Measurement Society
• IEEE Central Texas Council

Bibliographic Information

Autotestcon 2004 proceedings : IEEE Systems Readiness Technology Conference : technology and tradition unite in San Antonio

sponsors, IEEE Aerospace and Electronic Systems Society, IEEE Instrumentation and Measurement Society, IEEE Central Texas Council

Institute of Electrical and Electronic Engineers, c2004

Other Title

04CH37560

Note

"IEEE catalog number: 04CH37560"--T.p.

"San Antonio, TX, 20-23 September 2004"--Cover

Includes bibliographical references and index

Details

• NCID: BA72215822
• ISBN:
  • 0780384490
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Piscataway, N.J.]
• Pages/Volumes: xxxiv, 613 p.
• Size: 28 cm