1973 IEEE International Electromagnetic Compatibility Symposium Record, New York, N.Y., June 20, 21, 22, 1973

Author(s)

• IEEE International Symposium on Electromagnetic Compatibility

Bibliographic Information

1973 IEEE International Electromagnetic Compatibility Symposium Record, New York, N.Y., June 20, 21, 22, 1973

Institute of Electrical and Electronics Engineers, c1973

Note

Sponsored by the IEEE Group on Electromagnetic Compatibility. co-sponsored by the New York Section of the IEEE

"IEEE 73 CHO 7518 EMC"

Details

• NCID: BA72594491
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York, N.Y.
• Pages/Volumes: xiii, 365 p.
• Size: 28 cm