2005 IEEE International Reliability Physics Symposium proceedings : 43nd [i.e. 43rd] annual, San Jose, California, April 17-21, 2005

Author(s)

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

2005 IEEE International Reliability Physics Symposium proceedings : 43nd [i.e. 43rd] annual, San Jose, California, April 17-21, 2005

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2005

• : soft.

Note

Includes bibliographical references

"IEEE catalog no. 05CH37616" -- T.p.

Details

• NCID: BA7277267X
• ISBN:
  • 0780388038
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Piscataway, N.J.]
• Pages/Volumes: xii, 764 p.
• Size: 28 cm