2005 IEEE International Reliability Physics Symposium proceedings : 43nd [i.e. 43rd] annual, San Jose, California, April 17-21, 2005

著者

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2005 IEEE International Reliability Physics Symposium proceedings : 43nd [i.e. 43rd] annual, San Jose, California, April 17-21, 2005

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2005

• : soft.

注記

Includes bibliographical references

"IEEE catalog no. 05CH37616" -- T.p.

• NII書誌ID(NCID): BA7277267X
• ISBN:
  • 0780388038
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Piscataway, N.J.]
• ページ数/冊数: xii, 764 p.
• 大きさ: 28 cm