ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium

著者

• IEEE International Conference on Microelectronic Test Structures
• IEEE Electron Devices Society

書誌事項

ICMTS 2005 : proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium

sponsored by the IEEE Electron Devices Society

Institute of Electrical and Electronics Engineers, c2005

注記

"IEEE catalog number: 05CH37622" -- T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA73137305
• ISBN:
  • 0780388550
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Piscataway, N.J.]
• ページ数/冊数: xii, 270 p.
• 大きさ: 30 cm