Proceedings of the Transistor Reliability Symposium, September 17 and 18, 1956

Author(s)

• U. S. Advisory Group on Electron Tubes
• Transistor Reliability Symposium
• United States. Office of Assistant Secretary of Defense (Research and Engineering)

Bibliographic Information

Proceedings of the Transistor Reliability Symposium, September 17 and 18, 1956

sponsored by the Working Group on Semiconductor Devices of the Advisory Group on Electron Tubes, Office of the Assistant Secretary of Defense, Research and Engineering

New York University Press, 1958

Details

• NCID: BA73223826
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: New York
• Pages/Volumes: 128 p.
• Size: 28 cm