ARPA/NBS workshop I. measurement problems in integrated circuit processing and assembly

著者

• Schafft, Harry A.

書誌事項

ARPA/NBS workshop I. measurement problems in integrated circuit processing and assembly

Harry A. Schafft

（NBS special publication, 400-3 . Semiconductor measurement technology）

U.S. G.P.O., 1974

電子リソースにアクセスする 全2件

• ARPA/NBS workshop I: measurement problems in integrated circuit processing and assembly [by] Harry A. Schafft.

  1974

  HathiTrust

• ARPA/NBS workshop I: measurement problems in integrated circuit processing and assembly [by] Harry A. Schafft. (400-3)

  1974

  HathiTrust

• NII書誌ID(NCID): BA73253907
• LCCN: 74600001
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington
• ページ数/冊数: iv, 18 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QC100
  • LCC : TK7874
  • DC : 389/.08 s
  • DC : 621.381/73
• 件名:
  • LCSH : Integrated circuits -- Congresses
  • LCSH : Semiconductors -- Congresses
  • LCSH : Electronic measurements -- Congresses
• 親書誌ID:
  • BA0011083X