ARPA/NBS workshop I. measurement problems in integrated circuit processing and assembly

Author(s)

• Schafft, Harry A.

Bibliographic Information

ARPA/NBS workshop I. measurement problems in integrated circuit processing and assembly

Harry A. Schafft

（NBS special publication, 400-3 . Semiconductor measurement technology）

U.S. G.P.O., 1974

Access to Electronic Resource 2 items

• ARPA/NBS workshop I: measurement problems in integrated circuit processing and assembly [by] Harry A. Schafft.

  1974

  HathiTrust

  

• ARPA/NBS workshop I: measurement problems in integrated circuit processing and assembly [by] Harry A. Schafft.

  400-3 1974

  HathiTrust

  

Details

• NCID: BA73253907
• LCCN: 74600001
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington
• Pages/Volumes: iv, 18 p.
• Size: 26 cm
• Classification:
  • LCC : QC100
  • LCC : TK7874
  • DC : 389/.08 s
  • DC : 621.381/73
• Subject Headings:
  • LCSH : Integrated circuits -- Congresses
  • LCSH : Semiconductors -- Congresses
  • LCSH : Electronic measurements -- Congresses
• Parent Bibliography ID:
  • BA0011083X