Combined quarterly report, October 1, 1973 to March 31, 1974

著者

• Bullis, W. Murray

書誌事項

Combined quarterly report, October 1, 1973 to March 31, 1974

W. Murray Bullis, editor

（NBS special publication, 400-4 . Semiconductor measurement technology）

U.S. G.P.O., 1974

電子リソースにアクセスする 全7件

• Semiconductor measurement technology. Quarterly report. (July/Sept 1973 (r:400-1))

  1973

  HathiTrust

• Semiconductor measurement technology. Quarterly report. (1973 no.3 v.1974 no.3)

  1973

  HathiTrust

• Semiconductor measurement technology. Quarterly report. (1974 no.4)

  1974

  HathiTrust

• Semiconductor measurement technology combined quarterly report, October 1, 1973, to March 31, 1974 / W. Murray Bullis, editor ; jointly supported by the National Bureau of Standards, the Defense Nuclear Agency, and the Defense Advanced Research Projects Agency.

  1974

  HathiTrust

• Semiconductor measurement technology combined quarterly report, October 1, 1973, to March 31, 1974 / W. Murray Bullis, editor ; jointly supported by the National Bureau of Standards, the Defense Nuclear Agency, and the Defense Advanced Research Projects Agency. (400-4)

  1974

  HathiTrust

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注記

Includes bibliographical references and index

• NII書誌ID(NCID): BA73254138
• LCCN: 75601512
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington
• ページ数/冊数: x, 89 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QC100
  • DC : 602/.1 s
  • DC : 621.3815/2/028
• 件名:
  • LCSH : Semiconductors -- Testing
• 親書誌ID:
  • BA0011083X