2004 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004

著者

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

書誌事項

2004 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

The Electron Devices Society and the Reliability Society of the Institute of Electrical and Electronics Engineers, c2004

• : softbound

タイトル別名

04TH8752

2004 IRW

注記

"IEEE Catalog No. 04TH8752"--T.p. verso

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA73262260
• ISBN:
  • 0780385179
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Piscataway, N.J.]
• ページ数/冊数: vi, 222 p.
• 大きさ: 28 cm