2004 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004

Bibliographic Information

2004 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

The Electron Devices Society and the Reliability Society of the Institute of Electrical and Electronics Engineers, c2004

  • : softbound

Other Title

04TH8752

2004 IRW

Available at  / 1 libraries

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Note

"IEEE Catalog No. 04TH8752"--T.p. verso

Includes bibliographical references

Details

  • NCID
    BA73262260
  • ISBN
    • 0780385179
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    [Piscataway, N.J.]
  • Pages/Volumes
    vi, 222 p.
  • Size
    28 cm
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