High performance instrumentation and automation
著者
書誌事項
High performance instrumentation and automation
Taylor & Francis, 2005
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注記
Includes bibliographical references and index
HTTP:URL=http://www.loc.gov/catdir/toc/ecip055/2004030435.html Information=Table of contents
内容説明・目次
内容説明
Improvements in process control, such as defined-accuracy instrumentation structures and computationally intelligent process modeling, enable advanced capabilities such as molecular manufacturing. High Performance Instrumentation and Automation demonstrates how systematizing the design of instrumentation and automation leads to higher performance through more homogeneous systems, which are frequently assisted by rule-based, fuzzy logic, and neural network process descriptions.
Incorporate Advanced Performance Enhancements into Your Automation Enterprise
The book illustrates generic common core process-to-control concurrent engineering linkages applied to a variety of laboratory and industry automation systems. It outlines:
Product properties translated into realizable process variables
Axiomatic decoupling of subprocess variables for improved robustness
Production planner model-driven goal state execution
In situ sensor and control structures for attenuating process disorder
Apparatus tolerance design for minimizing process variabilities
Production planner remodeling based on product features measurement for quality advancement
Coverage also includes multisensor data fusion, high-performance computer I/O design guided by comprehensive error modeling, multiple sensor algorithmic error propagation, robotic axes volumetric accuracy, quantitative video digitization and reconstruction evaluation, and in situ process measurement methods.
High Performance Instrumentation and Automation reflects the experience of engineer and author Patrick Garrett, including his role as co-principal investigator for an Air Force intelligent manufacturing initiative.
You can download Analysis Suite.xls, computer-aided design instrumentation software, available in the book's description on the CRC Press website.
目次
Thermal, Mechanical, Quantum, and Analytical Sensors. Instrumentation Amplifiers and Parameter Errors. Instrumentation Filters with Nominal Error. Signal Acquisition, Conditioning, and Processing. Data Conversion Devices and Errors. Sampled Data and Recovery with Intersample Error. Advanced Instrumentation Systems and Error Analysis. Automation Systems Concurrent Engineering. Molecular Beam Epitaxy Semiconductor Processing. Aerospace Composites Rule-Based Manufacturing. Fuzzy Logic Laser Deposition Superconductor Production. Neural Network Directed Steel Annealing. X-Ray Controlled Vapor Infiltration Ceramic Densification.
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