Proceedings : Fortieth Annual Meeting Electron Microscopy Society of America, Washington, D.C., August 9-13, 1982

Author(s)

• Annual Meeting Electron Microscopy Society of America
• Bailey, G. W.
• Electron Microscopy Society of America

Bibliographic Information

Proceedings : Fortieth Annual Meeting Electron Microscopy Society of America, Washington, D.C., August 9-13, 1982

editor, G. W. Bailey

Claitor's Pub. Div., 1982

Other Title

Electron Microscopy

Note

Includes bibliographical references and index

Details

• NCID: BA7404552X
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Baton Rouge
• Pages/Volumes: 757 p.
• Size: 27 cm