Radiation effects and soft errors in integrated circuits and electronic devices

Author(s)

• Schrimpf, Ronald Donald
• Fleetwood, D. M. (Dan M.)

Bibliographic Information

Radiation effects and soft errors in integrated circuits and electronic devices

editors, R.D. Schrimpf, D.M. Fleetwood

（Selected topics in electronics and systems, v. 34）

World Scientific, c2004

Note

Includes bibliographical references

Details

• NCID: BA74154638
• ISBN:
  • 9812389407
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: River Edge, N.J.
• Pages/Volumes: viii, 339 p.
• Size: 26 cm
• Parent Bibliography ID:
  • BA26914876