IEEE trial-use standard for Test Equipment Decription Language (TEDL)

著者

• IEEE Computer Society. Test Equipment Description Subcommitte

書誌事項

IEEE trial-use standard for Test Equipment Decription Language (TEDL)

Sponsor, IEEE SCC20 Test Equipment Description Subcommitte of the IEEE Standards Board

（IEEE std, 993-1990）

Institute of Electrical and Electronics Engineers, c1990

注記

"Approved February 15, 1990 IEEE Standards Board"--T.p

詳細情報

• NII書誌ID(NCID): BA7449947X
• ISBN:
  • 1559370297
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: 1 vol
• 大きさ: 28 cm
• 親書誌ID:
  • BA27047858