DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA

Author(s)

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• Aitken, Robert
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA

edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

IEEE Computer Society, c2005

Other Title

International Symposium on Defect and Fault Tolerance in VLSI Systems

Defect and fault tolerance in VLSI systems

Note

"IEEE Computer Society Order Number P2464"--T.p. verso

Includes bibliographical references and author index

Details

• NCID: BA74546795
• ISBN:
  • 0769524648
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xii, 602 p.
• Size: 23 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses
  • LCSH : Fault-tolerant computing -- Congresses