DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA

著者

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• Aitken, Robert
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council

書誌事項

DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA

edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

IEEE Computer Society, c2005

タイトル別名

International Symposium on Defect and Fault Tolerance in VLSI Systems

Defect and fault tolerance in VLSI systems

注記

"IEEE Computer Society Order Number P2464"--T.p. verso

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BA74546795
• ISBN:
  • 0769524648
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xii, 602 p.
• 大きさ: 23 cm
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Design and construction -- Congresses
  • LCSH : Fault-tolerant computing -- Congresses