On the cutting edge of globalization : an inquiry into American elites
著者
書誌事項
On the cutting edge of globalization : an inquiry into American elites
Rowman & Littlefield, c2006
- : pbk
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注記
Includes index
Other authors: David C. Earnest, Yale H. Ferguson, Ole R. Holsti
内容説明・目次
内容説明
Woefully little systematic knowledge is available about leaders who shape and sustain globalization. On the Cutting Edge of Globalization is the first systematic study to investigate elite attitudes toward the emergent structures of world affairs. Surveys of more than 1700 American leaders before and after 9/11 yield compelling and provocative findings that depict the attitudes and activities of an important group of people who, even as they collectively influence the course of events, are not linked and coordinated in their efforts. Chock full of original data, the book's unique contribution is enhanced by an entertaining narrative explanation that casts a Cutting Edger, an Other Leader, and a Researcher in a good natured argument about the meaning of social science inquiry and the validity of survey data. From an author group as powerful as the targets of their inquiry comes this one-of-a-kind, intriguing, and thoroughgoing analysis. Click here to view additional tables and spreadsheets.
目次
Chapter 1 Preface Chapter 2 On the Cutting Edge of Globalization Chapter 3 Theoretical Perspectives Chapter 4 The 1999 and 2003 Surveys: Identifying the Cutting-Edgers Chapter 5 How Do You Know A Cutting-Edger When You Encounter One? Chapter 6 Connectivity on the Cutting-Edge Chapter 7 Leadership, Affiliations, and Loyalties Chapter 8 Orientations Toward Globalization Chapter 9 Attitudes Toward World Affairs Chapter 10 From 1999 to 2003: Did Intervening Events Make a Difference? Chapter 11 Occupational Differences (and Similarities) Chapter 12 Conclusion Appendix A 13 Procedures for Identifying Elites on the Cutting Edge of Globalization Appendix B 14 Factor Analysis for Index on Involvement in Global Processes Appendix C 15 1999 Questionnaire Appendix D 16 2003 Questionnaire
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