Learning systems and pattern recognition in industrial control : applying artificial intelligence to industrial control ; proceedings of the Ninth Annual Advanced Control Conference, West Lafayette, Indiana, September 19-21, 1983

著者

• Advanced Control Conference
• Kompass, E. J.
• Williams, Theodore Joseph
• Purdue Laboratory for Applied Industrial Control

書誌事項

Learning systems and pattern recognition in industrial control : applying artificial intelligence to industrial control ; proceedings of the Ninth Annual Advanced Control Conference, West Lafayette, Indiana, September 19-21, 1983

sponsored by Control Engineering and the Purdue Laboratory for Applied Industrial Control ; E.J. Kompass and T.J. Williams, editors

Control Engineering, c1983

注記

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA75279570
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Barrington, Ill.
• ページ数/冊数: 91 p.
• 大きさ: 29 cm
• 件名:
  • LCSH : Automatic control -- Congresses
  • LCSH : Artificial intelligence -- Data processing -- Congresses
  • LCSH : Pattern recognition systems -- Congresses