Manual of patent examining procedure

著者

• United States. Dept. of Commerce
• United States. Patent and Trademark Office

書誌事項

Manual of patent examining procedure

U.S. department of commerce, United States patent and trademark office

U.S. department of commerce , United States patent and trademark office, 2004

Original 8th ed., rev. 2

タイトル別名

MPEP

米国特許審査便覧

注記

Distributor: Superintendent of Documents U.S. Government Printing Office

Includes index

Previous ed.: Feb. 2003

• NII書誌ID(NCID): BA75573465
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington, DC,Washington, DC
• ページ数/冊数: 1 v. (loose-leaf)
• 大きさ: 28 cm