Proceedings, 32nd Applied Imagery Pattern Recognition Workshop : October 15-17, 2003, Washington, D.C.

Author(s)

• Applied Imagery Pattern Recognition Workshop
• Williams, Elmer
• IEEE Computer Society. Technical Committee on Pattern Analysis and Machine Intelligence

Bibliographic Information

Proceedings, 32nd Applied Imagery Pattern Recognition Workshop : October 15-17, 2003, Washington, D.C.

sponsored by IEEE Computer Society Technical Committee on Pattern Analysis and Machine Intelligence ; presented by AIPR - Applied Imagery Pattern Recognition ; [edited by Elmer Williams]

IEEE Computer Society, 2004

Other Title

32nd Applied Imagery Pattern Recognition Workshop : image data fusion

AIPR 2003

Note

Includes bibliographical references and index

"IEEE Computer Society Order no. P2029"

Details

• NCID: BA76209209
• ISBN:
  • 0769520294
• LCCN: 2004100407
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, CA
• Pages/Volumes: x, 290 p.
• Size: 28 cm
• Classification:
  • LCC : TA1650
  • DC21 : 621.36/7
• Subject Headings:
  • LCSH : Optical pattern recognition -- Congresses
  • LCSH : Image processing -- Congresses