Fourth annual seminar on failure analysis : proceedings, May 20, 1971

著者

• Institute of Electrical and Electronics Engineers. Philadelphia Section
• IEEE Reliability Group

書誌事項

Fourth annual seminar on failure analysis : proceedings, May 20, 1971

, IEEE Philadelphia Section and Reliability Group , [1971]

タイトル別名

Failure analysis : 4th annual seminar at the University of Pennsylvania, 20 May 1971

詳細情報

• NII書誌ID(NCID): BA76567876
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Philadelphia]
• ページ数/冊数: 1 v.
• 大きさ: 28 cm