Bibliographic Information

Silicon micromachining

M. Elwenspoek and H.V. Jansen

(Cambridge studies in semiconductor physics and microelectronic engineering, 7)

Cambridge University Press, 2004

  • : pbk

Available at  / 4 libraries

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Note

"First paperback edition 2004"--T.p. verso

Includes bibliographical references and index

Description and Table of Contents

Description

This comprehensive book provides an overview of the key techniques used in the fabrication of micron-scale structures in silicon. Recent advances in these techniques have made it possible to create a new generation of microsystem devices, such as microsensors, accelerometers, micropumps, and miniature robots. The authors underpin the discussion of each technique with a brief review of the fundamental physical and chemical principles involved. They pay particular attention to methods such as isotropic and anisotropic wet chemical etching, wafer bonding, reactive ion etching, and surface micromachining. There is a special section on bulk micromachining, and the authors also discuss release mechanisms for movable microstructures. The book is a blend of detailed experimental and theoretical material, and will be of great interest to graduate students and researchers in electrical engineering and materials science whose work involves the study of micro-electromechanical systems (MEMS).

Table of Contents

  • 1. Introduction
  • 2. Anisotropic wet chemical etching
  • 3. Chemical physics of wet chemical etching
  • 4. Waferbonding
  • 5. Examples and applications
  • 6. Surface micromachining
  • 7. Isotropic wet chemical etching of silicon
  • 8. Introduction into dry etching
  • 9. Why plasmas?
  • 10. Plasma system configurations
  • 11. What is plasma etching?
  • 12. Contact plasma etching
  • 13. Remote plasma etching
  • 14. High aspect ratio trench etching
  • 15. Moulding of microstructures
  • 16. Fabrication of movable microstructures.

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Details

  • NCID
    BA77002920
  • ISBN
    • 0521607671
  • Country Code
    uk
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Cambridge ; New York, N.Y.
  • Pages/Volumes
    xiii, 405 p.
  • Size
    25 cm
  • Classification
  • Subject Headings
  • Parent Bibliography ID
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