Proceedings, 10th International Symposium on Software Metrics : Chicago, Illinois, September 11-17, 2004

著者

• International Software Metrics Symposium
• IEEE Computer Society. Technical Council on Software Engineering

書誌事項

Proceedings, 10th International Symposium on Software Metrics : Chicago, Illinois, September 11-17, 2004

sponsored by IEEE Computer Society Technical Council on Software Engineering (TCSE)

IEEE Computer Society, c2004

タイトル別名

METRICS 2004

10th International Symposium on Software metrics

Tenth International Symposium on Software Metrics

注記

"METRICS 2004"--Half t.p

"IEEE Computer Society Order Number P2129"--T.p. verso

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA77191153
• ISBN:
  • 0769521290
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xii, 417 p.
• 大きさ: 27 cm
• 件名:
  • LCSH : Computer software -- Quality control -- Congresses
  • LCSH : Software measurement -- Congresses
  • LCSH : Software maintenance -- Congresses