2004 ROCS Workshop : proceedings : October 24, 2004, Monterey, California

著者

• ROCS Workshop
• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

書誌事項

2004 ROCS Workshop : proceedings : October 24, 2004, Monterey, California

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc

JEDEC , IEEE, [c2004]

タイトル別名

GaAs Reliability Workshop

ROCS Workshop - Reliability of Compound Semiconductors

04TH8787

注記

"IEEE Catalog Number: 04TH8787"--T.p. verso

"ROCS Workshop (formerly the GaAs REL Workshop)"--cover

Includes bibliographic references

"ROCS Workshop - Reliability of Compound Semiconductors Proceedings"--p. ii

詳細情報

• NII書誌ID(NCID): BA77714273
• ISBN:
  • 0790801051
• LCCN: 2005282512
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Arlington, Va.,Piscataway, N.J.
• ページ数/冊数: vi, 150 p.
• 大きさ: 28 cm
• 分類:
  • LCC : TK7871.15.G3
  • DC22 : 621.3815/2
• 件名:
  • LCSH : Gallium arsenide semiconductors -- Congresses
  • LCSH : Semiconductors -- Reliability -- Congresses
  • LCSH : Semiconductors -- Materials -- Congresses
• リンク:
  • ieeexplore.ieee.org/servlet/opac?punumber=9750