2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
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書誌事項
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
IEEE Electron Devices Society : IEEE Reliability Society, c2005
- タイトル別名
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IIRW 2005
05TH8799
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注記
At head of title: IEEE
"IEEE Catalog No.: 05TH8799"--T.p. verso
Includes bibliographical references
