2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005

Author(s)

• International Integrated Reliability Workshop
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Electron Devices Society : IEEE Reliability Society, c2005

Other Title

IIRW 2005

05TH8799

Note

At head of title: IEEE

"IEEE Catalog No.: 05TH8799"--T.p. verso

Includes bibliographical references

Details

• NCID: BA77792685
• ISBN:
  • 0780389921
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: vi, 182 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Integrated circuits -- Reliability -- Congresses
  • LCSH : Integrated circuits -- Wafer-scale integration -- Reliability -- Congresses
• Link:
  • ieeexplore.ieee.org/servlet/opac?punumber=10702