Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
Author(s)
Bibliographic Information
Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces
（Nanoscience and technology）
Springer, c2006
- : pbk
Available at / 9 libraries
-
No Libraries matched.
- Remove all filters.
Note
Includes bibliographical references and index
