Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces

Bibliographic Information

Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces

G. Kaupp

(Nanoscience and technology)

Springer, c2006

  • : pbk

Available at  / 9 libraries

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Note

Includes bibliographical references and index

Related Books: 1-1 of 1

Details

  • NCID
    BA78008037
  • ISBN
    • 3540284052
    • 9783642066634
  • Country Code
    gw
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Berlin
  • Pages/Volumes
    xii, 292 p.
  • Size
    24 cm
  • Parent Bibliography ID
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