Stress-induced phenomena in metallization : eighth International Workshop on Stress-Induced Phenomena in Metallization : Dresden, Germany, 12-14 September 2005

書誌事項

Stress-induced phenomena in metallization : eighth International Workshop on Stress-Induced Phenomena in Metallization : Dresden, Germany, 12-14 September 2005

editors, Ehrenfried Zschech ... [et al.]

(AIP conference proceedings, vol. 817)

American Institute of Physics, c2006

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注記

Includes indexes

内容説明・目次

内容説明

These proceedings present current research on issues related to stress-induced phenomena in on-chip metal interconnects and solder joints. This volume will appeal to scientists, engineers, graduate students interested in research and development of microelectronic devices as well as technology integration, and semiconductor industry professionals and equipment suppliers.

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詳細情報

  • NII書誌ID(NCID)
    BA78338166
  • ISBN
    • 0735403104
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Melville, N.Y.
  • ページ数/冊数
    xi, 372 p.
  • 大きさ
    25 cm
  • 親書誌ID
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