2005 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2005 : September 1-3, 2005, Komaba Eminence, Tokyo, Japan

Author(s)

• International Conference on Simulation of Semiconductor Devices and Processes
• 応用物理学会 オウヨウ ブツリ ガッカイ
• IEEE Electron Devices Society
• 電子情報通信学会 デンシ ジョウホウ ツウシン ガッカイ
• IEEE EDS Japan Chapter
• IEEE EDS Kansai Chapter

Bibliographic Information

2005 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2005 : September 1-3, 2005, Komaba Eminence, Tokyo, Japan

co-sponsored by Japan Society of Applied Physics, IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, IEEE EDS Japan Chapter, IEEE EDS Kansai Chapter

Japan Society of Applied Phyisics , IEEE, c2005

Other Title

05TH8826

AP051227

Note

"IEEE Catalog Number 05TH8826"--T.p. verso

"JSAP Catalog Number AP051227"--T.p. verso

Includes bibliographical references and author index

Details

• NCID: BA78343042
• ISBN:
  • 4990276205
• LCCN: 2006297204
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: [Tokyo],Piscataway, N.J.
• Pages/Volumes: xv, 340 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871.85
• Subject Headings:
  • LCSH : Semiconductors -- Mathematical models -- Congresses