Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]

Author(s)

• International Symposium on the Physical & Failure Analysis of Integrated Circuits
• Tung, Chih-Hang
• IEEE Reliability/CPMT/ED Singapore Chapter
• IEEE Electron Devices Society
• Centre for IC Failure Anlaysis & Reliability (CICFAR)
• National University of Singapore

Bibliographic Information

Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2005 : [27 June to 1 July 2005, Shangri-La's rasa Sentosa Resort, Singapore]

edited by Tung Chih-Hang ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapoer Chapter ; technically co-sponsored by IEEE Electron Devices Society ... [et al.] ; in co-operation with Centre for IC Failure Anlaysis & Reliability (CICFAR), National University of Singapore

IEEE, c2005

Other Title

05TH8827

Note

"IEEE Catalog Number 05TH8827"--T.p. verso

Includes bibliographical references and authors index

Details

• NCID: BA78343778
• ISBN:
  • 0780393015
• LCCN: 2006276365
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: 213 p.
• Size: 30 cm
• Classification:
  • LCC : TK7874
  • DC22 : 621.3815028/7
• Subject Headings:
  • LCSH : Integrated circuits -- Defects -- Congresses
  • LCSH : Integrated circuits -- Testing -- Congresses
• Link:
  • ieeexplore.ieee.org/servlet/opac?punumber=9910