2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California

Author(s)

• ROCS Workshop
• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

Bibliographic Information

2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc

JEDEC , IEEE, [c2005]

Other Title

05TH8858

GaAs Reliability Workshop

ROCS Workshop [Reliability of Compound Semiconductors]

Note

"IEEE Catalog Number: 05TH8858"--T.p. verso

"ROCS Workshop (formerly the GaAs REL Workshop)"--cover

"ROCS Workshop - Reliability of Compound Semiconductors Proceedings"--p. ii

Includes bibliographic references

Details

• NCID: BA78465775
• ISBN:
  • 079080106X
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Arlington, Va.,Piscataway, N.J.
• Pages/Volumes: viii, 180 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Gallium arsenide semiconductors -- Congresses
  • LCSH : Semiconductors -- Reliability -- Congresses
  • LCSH : Semiconductors -- Materials -- Congresses
• Link:
  • ieeexplore.ieee.org/servlet/opac?punumber=10460