2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California

著者

• ROCS Workshop
• GaAs Reliability Workshop
• JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards
• IEEE Electron Devices Society

書誌事項

2005 ROCS Workshop : proceedings : October 30, 2005, Palm Springs, California

sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc

JEDEC , IEEE, [c2005]

タイトル別名

05TH8858

GaAs Reliability Workshop

ROCS Workshop [Reliability of Compound Semiconductors]

注記

"IEEE Catalog Number: 05TH8858"--T.p. verso

"ROCS Workshop (formerly the GaAs REL Workshop)"--cover

"ROCS Workshop - Reliability of Compound Semiconductors Proceedings"--p. ii

Includes bibliographic references

詳細情報

• NII書誌ID(NCID): BA78465775
• ISBN:
  • 079080106X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Arlington, Va.,Piscataway, N.J.
• ページ数/冊数: viii, 180 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Gallium arsenide semiconductors -- Congresses
  • LCSH : Semiconductors -- Reliability -- Congresses
  • LCSH : Semiconductors -- Materials -- Congresses
• リンク:
  • ieeexplore.ieee.org/servlet/opac?punumber=10460