AUTOTESTCON 2005 : Orlando, FL, 26-29 September 2005
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AUTOTESTCON 2005 : Orlando, FL, 26-29 September 2005
IEEE, c2005
- Other Title
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05CH37671
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"IEEE Catalog Number: 05CH37671"
"Our conference theme, Technology Powering the Next Generation of Test, is reflected in our excellent technical program documented in these Proceedings"--p. iii
Includes bibliographical references and author index
