ToF-SIMS : surface analysis by mass spectrometry

著者

• Vickerman, J. C.
• Briggs, D.

書誌事項

ToF-SIMS : surface analysis by mass spectrometry

edited by John C. Vickerman and David Briggs

IM, c2001

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging and microanalysis, and shallow depth profiling. This is the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to: instrumentation and sample handling (three chapters); fundamentals and molecular dynamics simulations (four chapters); optimisation methods, including laser post-ionisation of sputtered neutrals (six chapters); data interpretation (two chapters), and analytical applications (eleven chapters). All the contributors are internationally recognised as leaders in their respective fields and come from both Europe and the USA.

目次

Prologue Insturmentation Fundamentals Optimisation Methods Data Interpretation Analytical Applications Index

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BA78492213
• ISBN:
  • 1901019039
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Chichester
• ページ数/冊数: ix, 789 p.
• 大きさ: 26 cm
• 分類:
  • DC21 : 541.33
  • NDC9 : 431.86
• 件名:
  • LCSH : Surfaces (Technology) -- Analysis
  • LCSH : Mass spectrometry