Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing

著者

• Ekin, Jack. W.

書誌事項

Experimental techniques for low-temperature measurements : cryostat design, material properties, and superconductor critical-current testing

Jack W. Ekin

Oxford University Press, 2006

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BA79313513
• ISBN:
  • 9780198570547
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xxviii, 673 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QC278
  • DC22 : 536/.54
• 件名:
  • LCSH : Low temperatures -- Measurement
  • LCSH : Low temperatures -- Instruments
  • LCSH : Low temperature research
  • LCSH : Superconductors