Transmission electron microscopy and diffractometry of materials

Author(s)

• Fultz, B.
• Howe, James M.

Bibliographic Information

Transmission electron microscopy and diffractometry of materials

Brent Fultz, James Howe

Springer, 2002

2nd ed., corrected 2nd printing

Note

Includes bibliographical references and index

"Physics and astronomy online library"--CIP on t.p. verso

Details

• NCID: BA79532674
• ISBN:
  • 3540437649
• Country Code: gw
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Berlin
• Pages/Volumes: xxi, 748 p.
• Size: 24 cm
• Classification:
  • LCC : TA417.23
  • DC21 : 620.1/1299
• Subject Headings:
  • LCSH : Materials -- Microscopy
  • LCSH : Transmission electron microscopy
  • LCSH : X-ray diffractometer