Transmission electron microscopy and diffractometry of materials

著者

• Fultz, B.
• Howe, James M.

書誌事項

Transmission electron microscopy and diffractometry of materials

Brent Fultz, James Howe

Springer, 2002

2nd ed., corrected 2nd printing

注記

Includes bibliographical references and index

"Physics and astronomy online library"--CIP on t.p. verso

詳細情報

• NII書誌ID(NCID): BA79532674
• ISBN:
  • 3540437649
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Berlin
• ページ数/冊数: xxi, 748 p.
• 大きさ: 24 cm
• 分類:
  • LCC : TA417.23
  • DC21 : 620.1/1299
• 件名:
  • LCSH : Materials -- Microscopy
  • LCSH : Transmission electron microscopy
  • LCSH : X-ray diffractometer