Proceedings, eighth IEEE International High-Level Design Validation and Test Workshop : 12-14 November, 2003, San Francisco, California

Author(s)

• IEEE International High-Level Design Validation and Test Workshop
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Design Automation Technical Committee

Bibliographic Information

Proceedings, eighth IEEE International High-Level Design Validation and Test Workshop : 12-14 November, 2003, San Francisco, California

sponsored by IEEE Computer Society Technical Council on Test Technology , IEEE Computer Society Technical Committee on Design Automation

IEEE Computer Society, c2003

Other Title

HLDVT '03 proceedings

HLDVT '03

Note

"IEEE Computer Society Order Number 03EX776"

Includes bibliographical references and author index

Details

• NCID: BA7957675X
• ISBN:
  • 0780382366
• LCCN: 2003113487
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: viii, 178 p.
• Size: 28 cm
• Subject Headings:
  • LCSH : Microprocessors -- Testing -- Congresses
  • LCSH : Computer software -- Verification -- Congresses
  • LCSH : Electronic circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Evaluation -- Congresses