Proceedings, eighth IEEE International High-Level Design Validation and Test Workshop : 12-14 November, 2003, San Francisco, California

著者

• IEEE International High-Level Design Validation and Test Workshop
• IEEE Computer Society. Test Technology Technical Council
• IEEE Computer Society. Design Automation Technical Committee

書誌事項

Proceedings, eighth IEEE International High-Level Design Validation and Test Workshop : 12-14 November, 2003, San Francisco, California

sponsored by IEEE Computer Society Technical Council on Test Technology , IEEE Computer Society Technical Committee on Design Automation

IEEE Computer Society, c2003

タイトル別名

HLDVT '03 proceedings

HLDVT '03

注記

"IEEE Computer Society Order Number 03EX776"

Includes bibliographical references and author index

詳細情報

• NII書誌ID(NCID): BA7957675X
• ISBN:
  • 0780382366
• LCCN: 2003113487
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: viii, 178 p.
• 大きさ: 28 cm
• 件名:
  • LCSH : Microprocessors -- Testing -- Congresses
  • LCSH : Computer software -- Verification -- Congresses
  • LCSH : Electronic circuits -- Testing -- Congresses
  • LCSH : Electronic digital computers -- Evaluation -- Congresses