2006 IEEE International Reliability Physics Symposium proceedings : 44th annual, San Jose, California, Marchl 26-30, 2006

Author(s)

• International Reliability Physics Symposium
• IEEE Electron Devices Society
• IEEE Reliability Society

Bibliographic Information

2006 IEEE International Reliability Physics Symposium proceedings : 44th annual, San Jose, California, Marchl 26-30, 2006

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2006

• v. 1 : soft.
• v. 2 : soft.

Note

Includes bibliographical references

"IEEE catalog no. 06CH37728" -- T.p.

Details

• NCID: BA80213378
• ISBN:
  • 0780394984
  • 0780394984
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Piscataway, N.J.
• Pages/Volumes: 2 v.
• Size: 28 cm