Proceedings, forty-sixth annual meeting, Electron Microscopy Society of America, jointly with Microscopical Society of Canada, fifteenth annual meeting

著者

• Annual Meeting Electron Microscopy Society of America
• Bailey, G. W.
• Microscopical Society of Canada. Annual Meeting

書誌事項

Proceedings, forty-sixth annual meeting, Electron Microscopy Society of America, jointly with Microscopical Society of Canada, fifteenth annual meeting

editor, G.W. Bailey

San Francisco Press, 1988

注記

Includes index

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BA80679669
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: San Francisco
• ページ数/冊数: xxxiii, 1022p
• 大きさ: 26 cm
• 件名:
  • LCSH : Electron microscopy -- Congresses