Proceedings, forty-sixth annual meeting, Electron Microscopy Society of America, jointly with Microscopical Society of Canada, fifteenth annual meeting

著者

• Annual Meeting Electron Microscopy Society of America
• Bailey, G. W.
• Microscopical Society of Canada. Annual Meeting

書誌事項

Proceedings, forty-sixth annual meeting, Electron Microscopy Society of America, jointly with Microscopical Society of Canada, fifteenth annual meeting

editor, G.W. Bailey

San Francisco Press, 1988

注記

Includes index

Includes bibliographical references

• NII書誌ID(NCID): BA80679669
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: San Francisco
• ページ数/冊数: xxxiii, 1022p
• 大きさ: 26 cm
• 件名:
  • LCSH : Electron microscopy -- Congresses