Analytical electron microscopy 1987 : proceedings of a workshop held at Kona, Hawaii, 13-17 July 1987

Bibliographic Information

Analytical electron microscopy 1987 : proceedings of a workshop held at Kona, Hawaii, 13-17 July 1987

D.C. Joy, editor

San Francisco Press, 1987

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Note

Sponsored by Microbeam Analysis Society in association with the Japanese Society for the Promotion of Science, Australian Microbeam Analysis Society

Details

  • NCID
    BA80706342
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    San Francisco, CA
  • Pages/Volumes
    vi, 382 p.
  • Size
    29 cm
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