2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

著者

• IEEE International Workshop on Memory Technology, Design, and Testing
• IEEE Computer Society. Test Technology Technical Council
• 清華大学 セイカ ダイガク qing hua da xue

書誌事項

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University

IEEE Computer Society, c2005

注記

"IEEE Computer Society Order Number P2313"--T.p. verso

Includes bibliographical references and author index

• NII書誌ID(NCID): BA80823517
• ISBN:
  • 0769523137
• LCCN: 2006278060
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Los Alamitos, Calif.
• ページ数/冊数: xxv, 153 p.
• 大きさ: 27 cm
• 分類:
  • LCC : TK7895.M4
  • DC22 : 621.39/732
• 件名:
  • LCSH : Semiconductor storage devices -- Testing -- Congresses
  • LCSH : Random access memory -- Congresses