Mentally defective children : with an appendix containing the Binet-Simon tests of intelligence

書誌事項

Mentally defective children : with an appendix containing the Binet-Simon tests of intelligence

by Alfred Binet and Th. Simon ; authorised translation by W. B. Drummond ; [appendix by] Margaret Drummond ; introduction by Alexander Darroch

Maruzen, [2007]

  • : hdc

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注記

Originally published by New York : Longmans, Green, and London : Edward Arnold , 1914

The UT back-in-print service's on-demand replica, produced at the University of Toronto

Includes index

詳細情報

  • NII書誌ID(NCID)
    BA81018902
  • 出版国コード
    uk
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    [Tokyo]
  • ページ数/冊数
    xi, 179 p.
  • 大きさ
    20 cm
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