Mentally defective children : with an appendix containing the Binet-Simon tests of intelligence

著者

• Binet, Alfred
• Simon, Théodore
• Drummond, William Blackley
• Drummond, Margaret B.
• Darroch, Alexander

書誌事項

Mentally defective children : with an appendix containing the Binet-Simon tests of intelligence

by Alfred Binet and Th. Simon ; authorised translation by W. B. Drummond ; [appendix by] Margaret Drummond ; introduction by Alexander Darroch

Maruzen, [2007]

• : hdc

注記

Originally published by New York : Longmans, Green, and London : Edward Arnold , 1914

The UT back-in-print service's on-demand replica, produced at the University of Toronto

Includes index

詳細情報

• NII書誌ID(NCID): BA81018902
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Tokyo]
• ページ数/冊数: xi, 179 p.
• 大きさ: 20 cm