Optical systems degradation, contamination, and stray light: effects, measurements, and control II : 15-16 August 2006, San Diego, California, USA

著者

    • Uy, O. Manuel

書誌事項

Optical systems degradation, contamination, and stray light: effects, measurements, and control II : 15-16 August 2006, San Diego, California, USA

O. Manuel Uy ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

(Proceedings / SPIE -- the International Society for Optical Engineering, v.6291)

SPIE, c2006

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注記

Includes bibliographical references and author index

内容説明・目次

内容説明

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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  • Proceedings

    SPIE -- the International Society for Optical Engineering

    SPIE -- the International Society for Optical Engineering

詳細情報

  • NII書誌ID(NCID)
    BA81343663
  • ISBN
    • 0819463701
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Bellingham, Wash.
  • ページ数/冊数
    1 v. (various pagings)
  • 大きさ
    28 cm
  • 親書誌ID
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