Annual Reliability and Maintainability Symposium, 2006 proceedings : the International Symposium on Product Quality and Integrity, Newport Beach, CA, USA, 2006 January 23-26

著者

• Reliability and Maintainability Symposium

書誌事項

Annual Reliability and Maintainability Symposium, 2006 proceedings : the International Symposium on Product Quality and Integrity, Newport Beach, CA, USA, 2006 January 23-26

Institute of Electrical and Electronics Engineers, c2006

• : set soft
• v. 1
• v. 2

注記

"IEEE catalog number: 06CH37744"--T. p. verso

Includes bibliographies and indexes

詳細情報

• NII書誌ID(NCID): BA81890826
• ISBN:
  • 1424400074
• LCCN: 78132873
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Piscataway, NJ
• ページ数/冊数: 2 v. 685 p.
• 大きさ: 27 cm