Proceedings : 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 4-6 October, 2006, Arlington, Virginia, USA

Author(s)

• IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
• Park, Nohpill
• IEEE Computer Society. Technical Committee on Fault-Tolerant Computing
• IEEE Computer Society. Test Technology Technical Council

Bibliographic Information

Proceedings : 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 4-6 October, 2006, Arlington, Virginia, USA

edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

IEEE Computer Society, c2006

Other Title

DPT2006

International Symposium on Defect and Fault Tolerance in VLSI Systems

Defect and fault tolerance in VLSI systems

Note

IEEE Computer Society Order Number P2706

Includes bibliographical references and author index

Details

• NCID: BA81902404
• ISBN:
  • 9780769527062
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Los Alamitos, Calif.
• Pages/Volumes: xii, 583 p.
• Size: 23 cm