Image pattern recognition : synthesis and analysis in biometrics

著者

書誌事項

Image pattern recognition : synthesis and analysis in biometrics

editors, Svetlana N. Yanushkevich ...[et al.] ; consulting editor, Mark S. Nixon

(Series in machine perception and artificial intelligence / editors, H. Bunke, P.S.P. Wang, v. 67)

World Scientific, c2007

大学図書館所蔵 件 / 8

この図書・雑誌をさがす

注記

Includes bibliographical references and indexes

"Some of the new ideas were first presented at the international workshop on 'Biometric Technologies: Modeling and Simulation' held in June 2004 in Calgary, Canada."-- p. vi

関連文献: 1件中  1-1を表示

詳細情報

ページトップへ