Image pattern recognition : synthesis and analysis in biometrics

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Bibliographic Information

Image pattern recognition : synthesis and analysis in biometrics

editors, Svetlana N. Yanushkevich ...[et al.] ; consulting editor, Mark S. Nixon

(Series in machine perception and artificial intelligence / editors, H. Bunke, P.S.P. Wang, v. 67)

World Scientific, c2007

Available at  / 8 libraries

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Includes bibliographical references and indexes

"Some of the new ideas were first presented at the international workshop on 'Biometric Technologies: Modeling and Simulation' held in June 2004 in Calgary, Canada."-- p. vi

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